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Please use this identifier to cite or link to this item: http://uvadoc.uva.es/handle/10324/35204
Title: In-line examination of Si wafers & solar cells using high resolution X-ray imaging methods [Poster]
Authors: Solórzano, Eusebio
Pérez Vasallo, Pablo
Conference: 17th Conference on Defects (DRIP XVII)
Issue Date: 2017
Citation: 17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain
Sponsor: Ministerio de Economía, Industria y Competitividad (Project BFU2014-53469P)
Note: Póster
Publisher Version: http://drip17.org/home/
Language: spa
URI: http://uvadoc.uva.es/handle/10324/35204
Rights: info:eu-repo/semantics/openAccess
Appears in Collections:DEP32 - Comunicaciones a congresos, conferencias, etc.

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