2024-03-28T22:07:24Zhttp://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/289632021-06-24T07:19:02Zcom_10324_1148com_10324_931com_10324_894com_10324_28025com_10324_954col_10324_1270col_10324_28026
Dudeck, Karleen J.
Marqués Cuesta, Luis Alberto
Knights, Andrew P.
Gwilliam, Russell M.
Botton, Gianluigi A.
2018-03-13T09:02:44Z
2018-03-13T09:02:44Z
2013
Physical Review Letters, 2013, Vol. 110, 166102
0031-9007
http://uvadoc.uva.es/handle/10324/28963
https://doi.org/10.1103/PhysRevLett.110.166102
Producción Científica
n this Letter we present the detailed, quantitative comparison between experimentally and theoretically derived structures of the extended {311} defect in silicon. Agreement between experimental and theoretical column positions of better than ±0.05 nm has been achieved for all 100 atomic columns in the defect structure. This represents a calculated density of 5.5×1014 silicon interstitials per cm2 on {311} planes, in agreement with previous work [S. Takeda, Jpn. J. Appl. Phys., Part 2, 30, L639 (1991)]. We show that although the {311} defect is made up of five-, six-, seven-, and eight-member rings, the shape of these rings varies as a function of position along the defect, and these variations can be determined experimentally with high precision and accuracy. The excellent agreement between the calculated and experimentally derived structure, including the position of atomic columns and the shape of the distinct structural units of the defect, provides strong evidence for the quality and robustness of the molecular dynamics simulation approach for structural studies of defects. The experimental approach is straightforward, without the need for complicated image processing methods, and is therefore widely applicable.
Ministerio de Ciencia e Innovación (Proyect TEC2011-27701)
application/pdf
eng
American Physical Society
info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/4.0/
Attribution-NonCommercial-NoDerivatives 4.0 International
Silicon
Silicio
Sub-ångstrom Experimental Validation of Molecular Dynamics for Predictive Modeling of Extended Defect Structures in Si
info:eu-repo/semantics/article
https://journals.aps.org/prl/abstract/10.1103/PhysRevLett.110.166102
SI