2024-03-29T11:25:52Zhttp://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/218012021-06-23T10:16:41Zcom_10324_1158com_10324_931com_10324_894col_10324_1242
00925njm 22002777a 4500
dc
Anaya, Julián
author
Torres, Alfredo
author
Jiménez López, Juan Ignacio
author
Prieto Colorado, Ángel Carmelo
author
Rodríguez, Andrés
author
Rodríguez, Tomás
author
Ballesteros, Carmen
author
2015
MicroRaman spectroscopy was used for the characterization of heterostructured
SiGe/Si nanowires. The NWs were grown with alloyed AuGa catalysts droplets with
different Ga compositions aiming to make more abrupt heterojunctions. The
heterojunctions were first characterized by TEM; then the NWs were scanned by the
laser beam in order to probe the heterojunction. The capability of the MicroRaman
spectroscopy for studying the heterojunction is discussed. The results show that the use
of catalysts with lower Ge and Si solubility (AuGa alloys) permits to achieve more
abrupt junctions.
MRS Proceedings, 2015, vol. 1751
http://uvadoc.uva.es/handle/10324/21801
10.1557/opl.2015.88
Enhanced Signal Micro-Raman
Enhanced Signal Micro-Raman Study of SiGe Nanowires and SiGe/Si Nanowire Axial Heterojuntions Grown Using Au and Ga-Au Catalysts