2024-03-28T17:39:13Zhttp://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/352042021-06-23T10:21:50Zcom_10324_1158com_10324_931com_10324_894col_10324_1244
In-line examination of Si wafers & solar cells using high resolution X-ray imaging methods [Poster]
17th Conference on Defects (DRIP XVII)
Solórzano Quijano, Eusebio
Pérez Vasallo, Pablo
Póster
Ministerio de Economía, Industria y Competitividad (Project BFU2014-53469P)
2019-03-22T14:09:57Z
2019-03-22T14:09:57Z
2017
info:eu-repo/semantics/conferenceObject
17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain
http://uvadoc.uva.es/handle/10324/35204
spa
http://drip17.org/home/
Attribution-NonCommercial-NoDerivatives 4.0 International
info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/4.0/
application/pdf