TY  - JOUR 
AU  - Santos Tejido, Iván
AU  - Ruiz Prieto, Manuel
AU  - Aboy Cebrián, María
AU  - Marqués Cuesta, Luis Alberto
AU  - López Martín, Pedro
AU  - Pelaz Montes, María Lourdes
PY  - 2018
SN  - 0361-5235
UR  - http://uvadoc.uva.es/handle/10324/30982
AB  - We used atomistic simulation tools to correlate experimental transmission electron microscopy images of extended defects in crystalline silicon with their structures at an atomic level. Reliable atomic configurations of extended defects were generated...
LA  - eng
PB  - Springer
KW  - Silicio cristalino
KW  - Microscopia electrónica
KW  - Crystalline silicon
TI  - Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation
DO  - https://doi.org/10.1007/s11664-018-6140-x
ER  -