TY  - JOUR 
AU  - Maldonado, D.
AU  - Vinuesa, G.
AU  - Aldana, S.
AU  - Aguirre, F.L.
AU  - Cantudo, A.
AU  - García, H.
AU  - González, M.B.
AU  - Jiménez-Molinos, F.
AU  - Campabadal, F.
AU  - Miranda, E.
AU  - Dueñas, S.
AU  - Castán, H.
AU  - Roldán, J.B.
PY  - 2024
SN  - 1369-8001
UR  - https://uvadoc.uva.es/handle/10324/66208
AB  - The switching dynamics of TiN/Ti/HfO2/W-based resistive memories is investigated. The analysis consisted in the systematic application of voltage sweeps with different ramp rates and temperatures. The obtained results give clear insight into the role...
LA  - eng
PB  - ELSEVIER
KW  - Resistive switching
KW  - RRAM
KW  - Operation dynamics
KW  - Characterization
KW  - Kinetic Monte Carlo
KW  - Compact modeling
TI  - A thorough investigation of the switching dynamics of TiN/Ti/10 nm-HfO2/W resistive memories
DO  - 10.1016/j.mssp.2023.107878
ER  -