TY  - JOUR 
AU  - Marqués Cuesta, Luis Alberto
AU  - Aboy Cebrián, María
AU  - Dudeck, Karleen J.
AU  - Botton, Gianluigi A.
AU  - Knights, Andrew P.
AU  - Gwilliam, Russell M.
PY  - 2014
SN  - 0021-8979
UR  - http://uvadoc.uva.es/handle/10324/28616
AB  - We propose an atomistic model to describe extended {311} defects in silicon. It is based on the combination of interstitial and bond defect chains. The model is able to accurately reproduce not only planar {311} defects but also defect structures that...
LA  - eng
PB  - AIP Publishing
KW  - Atomistic model
KW  - Silicon
KW  - Silicio
TI  - Modeling and experimental characterization of stepped and v-shaped {311} defects in silicon
DO  - https://doi.org/10.1063/1.4871538
ER  -