TY  - JOUR 
AU  - Landesman, Jean-Pierre
AU  - Cassidy, Daniel T.
AU  - Fouchier, Marc
AU  - Pargon, Erwine
AU  - Levallois, Christophe
AU  - Mokhtari, Merwan
AU  - Jiménez López, Juan Ignacio
AU  - Torres, Alfredo
PY  - 2018
UR  - http://uvadoc.uva.es/handle/10324/31318
AB  - We investigated deformation of InP that was introduced by
thin, narrow, dielectric SiNx stripes on the (100) surface of
InP substrates. Quantitative optical measurements were
performed using two different techniques based on luminescence
from the...
LA  - eng
PB  - Optical Society of America
KW  - Semiconductor materials; (250.5230) Photoluminescence; (250.1500) Cathodoluminescence; (310.4925) Other properties (stress, chemical, etc.); (310.5448) Polarization, other optical properties; (240.0310) Thin films
TI  - Mapping of mechanical strain induced by thin and narrow dielectric stripes on InP surfaces
DO  - https://doi.org/10.1364/OL.43.003505
ER  -