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IONDegradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions

López Martín, Pedro

; Aboy Cebrián, María

; Muñoz, I.; Santos Tejido, Iván

; Marqués Cuesta, Luis Alberto

; Couso, Carlos; Ullán, Miguel; Pelaz Montes, María Lourdes

(2019)