Automatic Quantitative Analysis of Silicon Solar Panels Based on Statistical Parameters from Electro- and Photoluminescence Images [Poster]

Abstract

There are many characterization techniques available to evaluate the health of solar panels, such as I-V characterization, infrared thermography (IR), photoluminescence (PL) and electroluminescence (EL). EL imaging has become in recent years a powerful diagnostic tool to evaluate PV modules. EL images allow to detect several defects and degradation modes in the solar cells. The failures are observed as dark contrasted areas in the images. Broad dark regions can be detected even in a low resolution image, while a high resolution image is needed to detect some more specific problems such as cracks, multi-cracks or other line-shaped defects.