Por favor, use este identificador para citar o enlazar este ítem:https://uvadoc.uva.es/handle/10324/52845
Título
Defect formation in degraded laser diodes
Congreso
Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) XVIII
Año del Documento
2019
Documento Fuente
Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) XVIII, Berlín, Alemania, 2019
Zusammenfassung
Conclusions
Local hot spots produce a thermal lensing effect that focuses the travelling wave on a point situated ~ 3 - 5 μm behind the heated region. If the heated region is fully degraded, the laser cavity modes
present maxima which are located ~ 3 - 5 μm in front of the degraded region. The simulations suggest that a new COD process would be triggered at about 3 μm from the previously heated/degraded
region, in good agreement with the experimental CL results
Patrocinador
Ministerio de Ciencia e Innovación (Proyecto de Investigación ENE2017-89561-C4-3-R)
Junta de Castilla y León (Proyecto de Investigación VA283P18)
Junta de Castilla y León (Proyecto de Investigación VA283P18)
Idioma
eng
Tipo de versión
info:eu-repo/semantics/draft
Derechos
openAccess
Aparece en las colecciones
Dateien zu dieser Ressource