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dc.contributor.authorValdivia, M. P.
dc.contributor.authorBouffetier, V.
dc.contributor.authorCollins, G. W.
dc.contributor.authorStoeckl, C.
dc.contributor.authorFilkins, T.
dc.contributor.authorMileham, C.
dc.contributor.authorRomanofsky, M.
dc.contributor.authorBegishev, I. A.
dc.contributor.authorTheobald, W.
dc.contributor.authorKlein, S. R.
dc.contributor.authorSchneider, M. K.
dc.contributor.authorBeg, F. N.
dc.contributor.authorCasner, A.
dc.contributor.authorStutman, D.
dc.contributor.authorPérez Callejo, Gabriel 
dc.date.accessioned2024-01-10T17:18:48Z
dc.date.available2024-01-10T17:18:48Z
dc.date.issued2022
dc.identifier.citationReview of Scientific Instruments, Noviembre 2022, vol. 93, n. 11, p. 115102es
dc.identifier.issn0034-6748es
dc.identifier.urihttps://uvadoc.uva.es/handle/10324/64394
dc.descriptionProducción Científicaes
dc.description.abstractTalbot–Lau x-ray interferometry is a refraction-based diagnostic that can map electron density gradients through phase-contrast methods. The Talbot–Lau x-ray deflectometry (TXD) diagnostics have been deployed in several high energy density experiments. To improve diagnostic performance, a monochromatic TXD was implemented on the Multi-Tera Watt (MTW) laser using 8 keV multilayer mirrors (Δθ/θ = 4.5%-5.6%). Copper foil and wire targets were irradiated at 1014–1015 W/cm2. Laser pulse length (∼10 to 80 ps) and backlighter target configurations were explored in the context of Moiré fringe contrast and spatial resolution. Foil and wire targets delivered increased contrast <30%. The best spatial resolution (<6 μm) was measured for foils irradiated 80° from the surface. Further TXD diagnostic capability enhancement was achieved through the development of advanced data postprocessing tools. The Talbot Interferometry Analysis (TIA) code enabled x-ray refraction measurements from the MTW monochromatic TXD. Additionally, phase, attenuation, and dark-field maps of an ablating x-pinch load were retrieved through TXD. The images show a dense wire core of ∼60 μm diameter surrounded by low-density material of ∼40 μm thickness with an outer diameter ratio of ∼2.3. Attenuation at 8 keV was measured at ∼20% for the dense core and ∼10% for the low-density material. Instrumental and experimental limitations for monochromatic TXD diagnostics are presented. Enhanced postprocessing capabilities enabled by TIA are demonstrated in the context of high-intensity laser and pulsed power experimental data analysis. Significant advances in TXD diagnostic capabilities are presented. These results inform future diagnostic technique upgrades that will improve the accuracy of plasma characterization through TXD.es
dc.format.mimetypeapplication/pdfes
dc.language.isoenges
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.titleCurrent advances on Talbot–Lau x-ray imaging diagnostics for high energy density experiments (invited)es
dc.typeinfo:eu-repo/semantics/articlees
dc.identifier.doi10.1063/5.0101865es
dc.identifier.publicationissue11es
dc.identifier.publicationtitleReview of Scientific Instrumentses
dc.identifier.publicationvolume93es
dc.peerreviewedSIes
dc.description.projectSubvenciones NNSA Nos. HEDLP DE-NA0003882 y DE-NA0003842
dc.identifier.essn1089-7623es
dc.type.hasVersioninfo:eu-repo/semantics/acceptedVersiones


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