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dc.contributor.authorStrauch, Dieter
dc.contributor.authorDorner, B.
dc.contributor.authorIvanov, A.A.
dc.contributor.authorKrisch, M.
dc.contributor.authorBosak, A.
dc.contributor.authorChoyke, Wolfgang J.
dc.contributor.authorStojetz, B.
dc.contributor.authorMalorny, Michael
dc.contributor.authorSerrano Gutiérrez, Jorge
dc.date.accessioned2024-01-30T12:30:26Z
dc.date.available2024-01-30T12:30:26Z
dc.date.issued2006
dc.identifier.citationMaterials Science Forum Vols 527-529 (2006) pp 689-694es
dc.identifier.urihttps://uvadoc.uva.es/handle/10324/65323
dc.description.abstractPreliminary results for the phonon dispersion curves of hexagonal 4H-SiC from experimental inelastic neutron (INS) and X-ray scattering (IXS) are reported and contrasted with those of cubic 3C-SiC and silicon. The experimental frequencies and scattering intensities are in excellent agreement with those from first-principles calculations using density-functional methods. The relative merits of the two experimental techniques and aspects of the density functional perturbation theory and the so-called frozen phonon method for the determination of the basic phonon properties are briefly outlined.es
dc.format.mimetypeapplication/pdfes
dc.language.isoenges
dc.publisherTrans Tech Publications Ltd.es
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses
dc.titlePhonons in SiC from INS, IXS, and Ab-Initio Calculationses
dc.typeinfo:eu-repo/semantics/articlees
dc.identifier.doi10.4028/www.scientific.net/MSF.527-529.689es
dc.identifier.publicationfirstpage689es
dc.identifier.publicationlastpage694es
dc.identifier.publicationtitleMaterials Science Forumes
dc.identifier.publicationvolume527-529es
dc.peerreviewedSIes
dc.identifier.essn1662-9752es
dc.type.hasVersioninfo:eu-repo/semantics/publishedVersiones


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