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    • Dpto. Física Teórica, Atómica y Óptica
    • DEP33 - Artículos de revista
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    Por favor, use este identificador para citar o enlazar este ítem:https://uvadoc.uva.es/handle/10324/75297

    Título
    X-ray microscopy and talbot imaging with the matter in extreme conditions X-ray imager at LCLS
    Autor
    Galtier, Eric
    Lee, Hae Ja
    Khaghani, Dimitri
    Boiadjieva, Nina
    McGehee, Peregrine
    Arnott, Ariel
    Arnold, Brice
    Berboucha, Meriame
    Cunningham, Eric
    Czapla, Nick
    Dyer, Gilliss
    Ettelbrick, Robert
    Hart, Philip
    Heimann, Philip
    Welch, Marc
    Makita, Mikako
    Gleason, Arianna E.
    Pandolfi, Silvia
    Sakdinawat, Anne
    Liu, Yanwei
    Wojcik, Michael J.
    Hodge, Daniel
    Sandberg, Richard
    Valdivia, Maria Pia
    Bouffetier, Victorien
    Seiboth, Frank
    Nagler, Bob
    Pérez Callejo, GabrielAutoridad UVA Orcid
    Año del Documento
    2025
    Editorial
    Nature Portfolio
    Descripción
    Producción Científica
    Documento Fuente
    Scientific Reports, Marzo 2025, vol. 15, n. 7588
    Abstract
    The last decade has shown the great potential that X-ray Free Electron Lasers (FEL) have to study High Energy Density (HED) physics. Experiments at FELs have made significant breakthroughs in Shock Physics and Dynamic Diffraction, Dense Plasma Physics and Warm Dense Matter Science, using techniques such as isochoric heating, inelastic scattering, small angle scattering and X-ray diffraction. In addition, and complementary to these techniques, the coherent properties of the FEL beam can be used to image HED samples with high fidelity. We present new imaging diagnostics and techniques developed at the Matter in Extreme Conditions (MEC) instrument at Linac Coherent Light Source (LCLS) over the last few years. We show results in Phase Contrast Imaging geometry, where the X-ray beam propagates from the target to a camera revealing its phase, as well as in Direct Imaging geometry, where a real image of the sample plane is produced in the camera with a spatial resolution down to 200 nm. Last, we show an implementation of the Talbot Imaging method allowing both X-ray phase and intensity measurements change introduced by a target with sub-micron resolution.
    ISSN
    2045-2322
    Revisión por pares
    SI
    DOI
    10.1038/s41598-025-91989-8
    Patrocinador
    The work of G.P.-C. has been supported by Research Grant No. PID2022-137632OB-I00 from the Spanish Ministry of Science and Innovation.
    Idioma
    eng
    URI
    https://uvadoc.uva.es/handle/10324/75297
    Tipo de versión
    info:eu-repo/semantics/publishedVersion
    Derechos
    openAccess
    Collections
    • DEP33 - Artículos de revista [202]
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    Attribution-NonCommercial-NoDerivatives 4.0 InternacionalExcept where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivatives 4.0 Internacional

    Universidad de Valladolid

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