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<dc:title>Exponential stability for nonautonomous functional differential equations with  state-dependent delay</dc:title>
<dc:creator>Maroto Camarena, Ismael</dc:creator>
<dc:creator>Núñez Jiménez, María del Carmen</dc:creator>
<dc:creator>Obaya, Rafael</dc:creator>
<dc:description>The properties of stability of a compact set $K$ which is positively invariant for a semiflow $(\W\times W^{1,\infty}([-r,0],\mathbb{R}^n),\Pi,\mathbb{R}^+)$ determined by a family of nonautonomous FDEs with state-dependent delay taking values in $[0,r]$ are analyzed. The solutions of the variational equation through the orbits of $K$ induce linear skew-product semiflows on the bundles $K\times W^{1,\infty}([-r,0],\mathbb{R}^n)$ and $\mK\times C([-r,0],\mathbb{R}^n)$. The coincidence of the upper-Lyapunov exponents for both semiflows is checked, and it is a fundamental tool to prove that the strictly negative character of this upper-Lyapunov exponent is equivalent to the exponential stability of $K$ in&#xd;
$\W\times W^{1,\infty}([-r,0],\mathbb{R}^n)$ and also to the exponential stability of this compact set when the supremum norm is taken in $W^{1,\infty}([-r,0],\mathbb{R}^n)$. In particular, the existence of a uniformly exponentially stable solution of a uniformly almost periodic FDE ensures the existence of exponentially stable almost periodic solutions.</dc:description>
<dc:date>2017-09-19T18:47:34Z</dc:date>
<dc:date>2017-09-19T18:47:34Z</dc:date>
<dc:date>2017</dc:date>
<dc:type>info:eu-repo/semantics/article</dc:type>
<dc:identifier>Discrete and Continuous Dynamical Systems, Series B 22 (8) 2017, 3167-3197</dc:identifier>
<dc:identifier>1531-3492</dc:identifier>
<dc:identifier>http://uvadoc.uva.es/handle/10324/25759</dc:identifier>
<dc:identifier>10.3934/dcdsb.2017169</dc:identifier>
<dc:language>eng</dc:language>
<dc:relation>info:eu-repo/grantAgreement/EC/H2020/643073</dc:relation>
<dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
<dc:publisher>American Institute of Mathematical Sciences</dc:publisher>
<dc:peerreviewed>SI</dc:peerreviewed>
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