2026-04-26T07:15:43Zhttps://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/313182025-03-26T19:10:05Zcom_10324_1158com_10324_931com_10324_894col_10324_1242
Mapping of mechanical strain induced by thin and narrow dielectric stripes on InP surfaces
Landesman, Jean-Pierre
Cassidy, Daniel T.
Fouchier, Marc
Pargon, Erwine
Levallois, Christophe
Mokhtari, Merwan
Jiménez López, Juan Ignacio
Torres, Alfredo
We investigated deformation of InP that was introduced by
thin, narrow, dielectric SiNx stripes on the (100) surface of
InP substrates. Quantitative optical measurements were
performed using two different techniques based on luminescence
from the InP: first, by degree of polarization of
photoluminescence; and second, by cathodoluminescence spectroscopy. The two techniques provide complementary information on deformation of the InP and thus together provide a means to evaluate approaches to simulation of the deformation owing to dielectric stripes. Ultimately, these deformations can be used to estimate changes in refractive index and gain that are a result of the stripes
2018-08-31
2018-08-31
2018
info:eu-repo/semantics/article
Optics Letters, Vol. 43, No. 15
http://uvadoc.uva.es/handle/10324/31318
10.1364/OL.43.003505
43
eng
https://www.osapublishing.org/ol/abstract.cfm?uri=ol-43-15-3505
info:eu-repo/semantics/openAccess
Optical Society of America