2026-05-05T20:46:08Zhttps://uvadoc.uva.es/oai/request

oai:uvadoc.uva.es:10324/351902021-06-23T10:21:35Zcom_10324_1158com_10324_931com_10324_894col_10324_1244

2019-03-22T08:45:45Z urn:hdl:10324/35190 High resolution LBIC characterization of defects in mc-Si solar cells [Poster] Sánchez, L.A. Moretón Fernández, Ángel Guada, Miguel Rodríguez Conde, Sofía Martínez Sacristán, Óscar González Rebollo, Miguel Ángel Jiménez López, Juan Ignacio Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal resolution using the Light-Beam Induced Current (LBIC) technique combined with a ELi - PLi system. 2019-03-22T08:45:45Z 2019-03-22T08:45:45Z 2017 info:eu-repo/semantics/conferenceObject 17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain http://uvadoc.uva.es/handle/10324/35190 eng http://drip17.org/home/ info:eu-repo/semantics/openAccess http://creativecommons.org/licenses/by-nc-nd/4.0/ Attribution-NonCommercial-NoDerivatives 4.0 International