<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-14T17:02:49Z</responseDate><request verb="GetRecord" identifier="oai:uvadoc.uva.es:10324/52845" metadataPrefix="dim">https://uvadoc.uva.es/oai/request</request><GetRecord><record><header><identifier>oai:uvadoc.uva.es:10324/52845</identifier><datestamp>2022-08-24T09:13:38Z</datestamp><setSpec>com_10324_1158</setSpec><setSpec>com_10324_931</setSpec><setSpec>com_10324_894</setSpec><setSpec>col_10324_1244</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:doc="http://www.lyncode.com/xoai" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
<dim:field mdschema="dc" element="contributor" qualifier="author" authority="edf8bf2b0cc9369e" confidence="600" orcid_id="0000-0002-3676-1712">Souto Bartolomé, Jorge Manuel</dim:field>
<dim:field mdschema="dc" element="contributor" qualifier="author" authority="79aa2f01f47526df" confidence="600" orcid_id="">Pura Ruiz, José Luis</dim:field>
<dim:field mdschema="dc" element="contributor" qualifier="author" authority="6f4a17f0223dde40" confidence="600" orcid_id="0000-0001-6079-332X">Jiménez López, Juan Ignacio</dim:field>
<dim:field mdschema="dc" element="date" qualifier="accessioned">2022-04-20T09:38:45Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="available">2022-04-20T09:38:45Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="issued">2019</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="citation" lang="es">Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) XVIII, Berlín, Alemania, 2019</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="uri">https://uvadoc.uva.es/handle/10324/52845</dim:field>
<dim:field mdschema="dc" element="description" qualifier="abstract" lang="es">Conclusions&#xd;
Local hot spots produce a thermal lensing effect that focuses the travelling wave on a point situated ~ 3 - 5 μm behind the heated region. If the heated region is fully degraded, the laser cavity modes&#xd;
present maxima which are located ~ 3 - 5 μm in front of the degraded region. The simulations suggest that a new COD process would be triggered at about 3 μm from the previously heated/degraded&#xd;
region, in good agreement with the experimental CL results</dim:field>
<dim:field mdschema="dc" element="description" qualifier="project" lang="es">Ministerio de Ciencia e Innovación (Proyecto de Investigación ENE2017-89561-C4-3-R)</dim:field>
<dim:field mdschema="dc" element="description" qualifier="project" lang="es">Junta de Castilla y León (Proyecto de Investigación VA283P18)</dim:field>
<dim:field mdschema="dc" element="format" qualifier="mimetype" lang="es">application/pdf</dim:field>
<dim:field mdschema="dc" element="language" qualifier="iso" lang="es">eng</dim:field>
<dim:field mdschema="dc" element="rights" qualifier="accessRights" lang="es">info:eu-repo/semantics/openAccess</dim:field>
<dim:field mdschema="dc" element="title" lang="es">Defect formation in degraded laser diodes</dim:field>
<dim:field mdschema="dc" element="title" qualifier="event" lang="es">Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) XVIII</dim:field>
<dim:field mdschema="dc" element="type" lang="es">info:eu-repo/semantics/conferenceObject</dim:field>
<dim:field mdschema="dc" element="type" qualifier="hasVersion" lang="es">info:eu-repo/semantics/draft</dim:field>
</dim:dim></metadata></record></GetRecord></OAI-PMH>