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<dc:title>Defect formation in degraded laser diodes</dc:title>
<dc:title>Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) XVIII</dc:title>
<dc:creator>Souto Bartolomé, Jorge Manuel</dc:creator>
<dc:creator>Pura Ruiz, José Luis</dc:creator>
<dc:creator>Jiménez López, Juan Ignacio</dc:creator>
<dc:description>Conclusions&#xd;
Local hot spots produce a thermal lensing effect that focuses the travelling wave on a point situated ~ 3 - 5 μm behind the heated region. If the heated region is fully degraded, the laser cavity modes&#xd;
present maxima which are located ~ 3 - 5 μm in front of the degraded region. The simulations suggest that a new COD process would be triggered at about 3 μm from the previously heated/degraded&#xd;
region, in good agreement with the experimental CL results</dc:description>
<dc:description>Ministerio de Ciencia e Innovación (Proyecto de Investigación ENE2017-89561-C4-3-R)</dc:description>
<dc:description>Junta de Castilla y León (Proyecto de Investigación VA283P18)</dc:description>
<dc:date>2022-04-20T09:38:45Z</dc:date>
<dc:date>2022-04-20T09:38:45Z</dc:date>
<dc:date>2019</dc:date>
<dc:type>info:eu-repo/semantics/conferenceObject</dc:type>
<dc:type>info:eu-repo/semantics/draft</dc:type>
<dc:identifier>Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) XVIII, Berlín, Alemania, 2019</dc:identifier>
<dc:identifier>https://uvadoc.uva.es/handle/10324/52845</dc:identifier>
<dc:language>eng</dc:language>
<dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
<dc:format>application/pdf</dc:format>
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