<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-27T14:35:26Z</responseDate><request verb="GetRecord" identifier="oai:uvadoc.uva.es:10324/52845" metadataPrefix="qdc">https://uvadoc.uva.es/oai/request</request><GetRecord><record><header><identifier>oai:uvadoc.uva.es:10324/52845</identifier><datestamp>2022-08-24T09:13:38Z</datestamp><setSpec>com_10324_1158</setSpec><setSpec>com_10324_931</setSpec><setSpec>com_10324_894</setSpec><setSpec>col_10324_1244</setSpec></header><metadata><qdc:qualifieddc xmlns:qdc="http://dspace.org/qualifieddc/" xmlns:doc="http://www.lyncode.com/xoai" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xsi:schemaLocation="http://purl.org/dc/elements/1.1/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dc.xsd http://purl.org/dc/terms/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dcterms.xsd http://dspace.org/qualifieddc/ http://www.ukoln.ac.uk/metadata/dcmi/xmlschema/qualifieddc.xsd">
<dc:title>Defect formation in degraded laser diodes</dc:title>
<dc:creator>Souto Bartolomé, Jorge Manuel</dc:creator>
<dc:creator>Pura Ruiz, José Luis</dc:creator>
<dc:creator>Jiménez López, Juan Ignacio</dc:creator>
<dcterms:abstract>Conclusions&#xd;
Local hot spots produce a thermal lensing effect that focuses the travelling wave on a point situated ~ 3 - 5 μm behind the heated region. If the heated region is fully degraded, the laser cavity modes&#xd;
present maxima which are located ~ 3 - 5 μm in front of the degraded region. The simulations suggest that a new COD process would be triggered at about 3 μm from the previously heated/degraded&#xd;
region, in good agreement with the experimental CL results</dcterms:abstract>
<dcterms:dateAccepted>2022-04-20T09:38:45Z</dcterms:dateAccepted>
<dcterms:available>2022-04-20T09:38:45Z</dcterms:available>
<dcterms:created>2022-04-20T09:38:45Z</dcterms:created>
<dcterms:issued>2019</dcterms:issued>
<dc:type>info:eu-repo/semantics/conferenceObject</dc:type>
<dc:identifier>Defects-Recognition, Imaging and Physics in Semiconductors (DRIP) XVIII, Berlín, Alemania, 2019</dc:identifier>
<dc:identifier>https://uvadoc.uva.es/handle/10324/52845</dc:identifier>
<dc:language>eng</dc:language>
<dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
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