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oai:uvadoc.uva.es:10324/529002023-06-06T12:10:21Zcom_10324_1158com_10324_931com_10324_894col_10324_1243
UVaDOC author Sanchez, Luis Alberto author Moretón Fernández, Ángel author Jiménez Martín, Marta María author Rodríguez Conde, Sofía author Guada, Miguel author González Rebollo, Miguel Ángel author Martínez Sacristán, Óscar author Jiménez López, Juan Ignacio 2022-04-21T15:49:23Z 2022-04-21T15:49:23Z 2018 Proceedings of the 35th European Photovoltaic Solar Energy Conference and Exhibition. DOI: 10.4229/35thEUPVSEC20182018-2DV.3.36 3-936338-50-7 https://uvadoc.uva.es/handle/10324/52900 10.4229/35thEUPVSEC20182018-2DV.3.36 There is an increasing demand for characterizing multicrystalline solar cells at different stages of its service life. Luminescence techniques, e.g. electroluminescence (EL) and photoluminescence (PL), have acquired a paramount interest in the last years. These techniques are used in imaging mode, allowing to take a luminescence picture at a full wafer/cell scale. This imaging approach is fast and sensitive, but has a low spatial resolution, which avoids a detailed analysis of the defect distribution, which can led to misinterpretations about critical parameters as the minority carrier diffusion length, or the internal and external quantum efficiencies. If one complements these techniques with high spatial resolution techniques, such as light beam induced current (LBIC), one can study the electrical activity of the defects at a micrometric scale, providing additional understanding about the role played by the defects in full wafer/cell luminescence images. The combination of the macroscopic and microscopic resolution scales is necessary for the analysis of the full luminescence images in mc-Si solar cells. eng Electroluminescence imaging and light-beam induced current as characterization techniques of multi-crystalline si solar cells info:eu-repo/semantics/bookPart 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URL https://uvadoc.uva.es/bitstream/10324/52900/1/2DV.3.36_paper_Electrolumiscence%20imaging_L.A.Sanchez_35th%20EUPVSEC_2018.pdf File MD5 fe3bfaf62284a1284538e4cf5a3c6c6e 1190368 application/pdf 2DV.3.36_paper_Electrolumiscence imaging_L.A.Sanchez_35th EUPVSEC_2018.pdf