<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-04-26T22:07:27Z</responseDate><request verb="GetRecord" identifier="oai:uvadoc.uva.es:10324/57823" metadataPrefix="dim">https://uvadoc.uva.es/oai/request</request><GetRecord><record><header><identifier>oai:uvadoc.uva.es:10324/57823</identifier><datestamp>2022-12-19T20:00:38Z</datestamp><setSpec>com_10324_966</setSpec><setSpec>com_10324_952</setSpec><setSpec>com_10324_894</setSpec><setSpec>col_10324_967</setSpec></header><metadata><dim:dim xmlns:dim="http://www.dspace.org/xmlns/dspace/dim" xmlns:doc="http://www.lyncode.com/xoai" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.dspace.org/xmlns/dspace/dim http://www.dspace.org/schema/dim.xsd">
<dim:field mdschema="dc" element="contributor" qualifier="author" authority="e48ffc7e-4759-4668-abd5-80543fdf5b1d">Saludes Rodil, Sergio</dim:field>
<dim:field mdschema="dc" element="contributor" qualifier="author" authority="9ca531edc41e5b36" confidence="600" orcid_id="0000-0002-8538-5848">Baeyens Lázaro, Enrique</dim:field>
<dim:field mdschema="dc" element="contributor" qualifier="author" authority="3ddbb935-f5a3-48e3-847b-4a859970c652" confidence="600" orcid_id="">Rodríguez Juan, Carlos</dim:field>
<dim:field mdschema="dc" element="date" qualifier="accessioned">2022-12-19T10:41:37Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="available">2022-12-19T10:41:37Z</dim:field>
<dim:field mdschema="dc" element="date" qualifier="issued">2015</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="citation" lang="es">Sensors, 2015, vol. 18, n. 5, p. 10100-10117</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="issn" lang="es">1424-8220</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="uri">https://uvadoc.uva.es/handle/10324/57823</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="doi" lang="es">10.3390/s150510100</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="publicationfirstpage" lang="es">10100</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="publicationissue" lang="es">5</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="publicationlastpage" lang="es">10117</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="publicationtitle" lang="es">Sensors</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="publicationvolume" lang="es">15</dim:field>
<dim:field mdschema="dc" element="identifier" qualifier="essn" lang="es">1424-8220</dim:field>
<dim:field mdschema="dc" element="description" lang="es">Producción Científica</dim:field>
<dim:field mdschema="dc" element="description" qualifier="abstract" lang="es">An unsupervised approach to classify surface defects in wire rod manufacturing is developed in this paper. The defects are extracted from an eddy current signal and classified using a clustering technique that uses the dynamic time warping distance as the dissimilarity measure. The new approach has been successfully tested using industrial data. It is shown that it outperforms other classification alternatives, such as the modified Fourier descriptors.</dim:field>
<dim:field mdschema="dc" element="description" qualifier="project" lang="es">Ministerio de Economía y Competitividad through the INNPACTO program (project IPT–2012–0755–420000)</dim:field>
<dim:field mdschema="dc" element="format" qualifier="mimetype" lang="es">application/pdf</dim:field>
<dim:field mdschema="dc" element="language" qualifier="iso" lang="es">eng</dim:field>
<dim:field mdschema="dc" element="publisher" lang="es">MDPI</dim:field>
<dim:field mdschema="dc" element="rights" qualifier="accessRights" lang="es">info:eu-repo/semantics/openAccess</dim:field>
<dim:field mdschema="dc" element="rights" qualifier="uri" lang="*">http://creativecommons.org/licenses/by/4.0/</dim:field>
<dim:field mdschema="dc" element="rights" qualifier="holder" lang="es">© 2015 The Author(s)</dim:field>
<dim:field mdschema="dc" element="rights" lang="*">Atribución 4.0 Internacional</dim:field>
<dim:field mdschema="dc" element="subject" qualifier="classification" lang="es">Dynamic time warping</dim:field>
<dim:field mdschema="dc" element="subject" qualifier="classification" lang="es">Cluster analysis</dim:field>
<dim:field mdschema="dc" element="subject" qualifier="classification" lang="es">Modified Fourier descriptors</dim:field>
<dim:field mdschema="dc" element="subject" qualifier="classification" lang="es">Eddy current inspection</dim:field>
<dim:field mdschema="dc" element="subject" qualifier="unesco" lang="es">33 Ciencias Tecnológicas</dim:field>
<dim:field mdschema="dc" element="title" lang="es">Unsupervised classification of surface defects in wire rod production obtained by Eddy current sensors</dim:field>
<dim:field mdschema="dc" element="type" lang="es">info:eu-repo/semantics/article</dim:field>
<dim:field mdschema="dc" element="type" qualifier="hasVersion" lang="es">info:eu-repo/semantics/publishedVersion</dim:field>
<dim:field mdschema="dc" element="relation" qualifier="publisherversion" lang="es">https://www.mdpi.com/1424-8220/15/5/10100</dim:field>
<dim:field mdschema="dc" element="peerreviewed" lang="es">SI</dim:field>
</dim:dim></metadata></record></GetRecord></OAI-PMH>