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<dc:title>Empirical Characterization of ReRAM Devices Using Memory Maps and a Dynamic Route Map</dc:title>
<dc:creator>Picos, Rodrigo</dc:creator>
<dc:creator>Stavrinides, Stavros G.</dc:creator>
<dc:creator>Al Chawa, Mohamad Moner</dc:creator>
<dc:creator>de Benito, Carola</dc:creator>
<dc:creator>Dueñas Carazo, Salvador</dc:creator>
<dc:creator>Castán Lanaspa, María Helena</dc:creator>
<dc:creator>Hatzikraniotis, Euripides</dc:creator>
<dc:creator>Chua, Leon O.</dc:creator>
<dc:description>Memristors were proposed in the early 1970s by Leon Chua as a new electrical element&#xd;
linking charge to flux. Since that first introduction, these devices have positioned themselves to be&#xd;
considered as possible fundamental ones for the generations of electronic devices to come. In this&#xd;
paper, we propose a new way to investigate the effects of the electrical variables on the memristance&#xd;
of a device, and we successfully apply this technique to model the behavior of a TiN/Ti/HfO2/W&#xd;
ReRAM structure. To do so, we initially apply the Dynamic Route Map technique in the general&#xd;
case to obtain an approximation to the differential equation that determines the behaviour of the&#xd;
device. This is performed by choosing a variable of interest and observing the evolution of its own&#xd;
temporal derivative versus both its value and the applied voltage. Then, according to this technique,&#xd;
it is possible to obtain an approach to the governing equations with no need to make any assumption&#xd;
about the underlying physical mechanisms, by fitting a function to this. We have used a polynomial&#xd;
function, which allows accurate reproduction of the observed electrical behavior of the measured&#xd;
devices, by integrating the resulting differential equation system.</dc:description>
<dc:date>2024-02-09T09:58:56Z</dc:date>
<dc:date>2024-02-09T09:58:56Z</dc:date>
<dc:date>2022</dc:date>
<dc:type>info:eu-repo/semantics/article</dc:type>
<dc:identifier>Electronics 2022, 11(11), 1672: Resistive Memory Characterization, Simulation, and Compact Modeling,</dc:identifier>
<dc:identifier>https://uvadoc.uva.es/handle/10324/66073</dc:identifier>
<dc:identifier>10.3390/electronics11111672</dc:identifier>
<dc:identifier>1672</dc:identifier>
<dc:identifier>11</dc:identifier>
<dc:identifier>Electronics</dc:identifier>
<dc:identifier>11</dc:identifier>
<dc:identifier>2079-9292</dc:identifier>
<dc:language>spa</dc:language>
<dc:relation>https://www.mdpi.com/2079-9292/11/11/1672</dc:relation>
<dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
<dc:rights>http://creativecommons.org/licenses/by-nc-nd/4.0/</dc:rights>
<dc:rights>Attribution-NonCommercial-NoDerivatives 4.0 Internacional</dc:rights>
<dc:publisher>MDPI</dc:publisher>
<dc:peerreviewed>SI</dc:peerreviewed>
</ow:Publication>
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