2026-04-27T21:41:27Zhttps://uvadoc.uva.es/oai/request

oai:uvadoc.uva.es:10324/693492024-08-16T19:00:34Zcom_10324_1159com_10324_931com_10324_894col_10324_1310

Z-Pinch Interferometry Analysis With the Fourier-Based TNT Code Valdivia, Maria Pia Izquierdo, Luisa Veloso, Felipe Truong, Ann Hu, Hanyu Dilworth, Noah Bott-Suzuki, Simon C. Bouffetier, Victorien Pérez Callejo, Gabriel Física Producción Científica We present the analysis of interferometry diagnostics with the user-friendly Talbot Numerical Tool (TNT), a Fourier-based postprocessing code that enables real-time assessment of plasma systems. TNT performance was explored with visible and infrared interferometry in pulsed-power-driven Z -pinch configurations to expand its capabilities beyond Talbot X-ray interferometry in the high-intensity laser environment. TNT enabled accurate electron density characterization of magnetically driven plasma flows and shocks through phase-retrieval methods that did not require data modification or masking. TNT demonstrated enhanced resolution, detecting below 4% fringe shift, which corresponds to 8.7×1e15cm−2 within 28μm, approaching the laser probing system limit. TNT was tested against a well-known interferometry analysis software, delivering an average resolving power nearly ten times better (∼28μm versus ∼210μm) when resolving plasma ablation features. TNT demonstrated higher sensitivity when probing sharp electron density gradients in supersonic shocks. A maximum electron areal density of 4.1×1e17cm−2 was measured in the shocked plasma region, and a minimum electron density detection of ∼ 1.0×1e15cm−2 was achieved. When probing colliding plasma flows, the calculations of the effective adiabatic index and the associated errors were improved from γ∗=2.6±1.6 –1.4±0.2 with TNT postprocessing, contributing valuable data for the interpretation of radiative transport. Additional applications of TNT in the characterization of pulsed-power plasmas and beyond are discussed. 2024-08-16T10:04:39Z 2024-08-16T10:04:39Z 2024 info:eu-repo/semantics/article IEEE Transactions on Plasma Science, vol. 52, n. 6. 0093-3813 https://uvadoc.uva.es/handle/10324/69349 10.1109/TPS.2024.3420910 6 IEEE Transactions on Plasma Science 52 1939-9375 spa https://ieeexplore.ieee.org/document/10633898 info:eu-repo/semantics/restrictedAccess Institute of Electrical and Electronics Engineers Institute of Electrical ad Electronics Engineers SI