2026-04-27T22:00:42Zhttps://uvadoc.uva.es/oai/request

oai:uvadoc.uva.es:10324/805282025-12-11T20:00:48Zcom_10324_1159com_10324_931com_10324_894col_10324_1310

Bouffetier, V. Valdivia, M. P. Ceurvorst, L. Stutman, D. Rigon, G. Albertazzi, B. Koenig, M. Pikuz, T. Ozaki, N. Nakamura, H. Hironaka, Y. Miyanishi, K. Yabuuchi, T. Togashi, T. Sueda, K. Yabashi, M. Goudal, T. Mancelli, D. Casner, A. Pérez Callejo, Gabriel 2025 Producción Científica X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics. application/pdf https://uvadoc.uva.es/handle/10324/80528 spa American Institute of Physics Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities info:eu-repo/semantics/article TEXT UVaDOC. Repositorio Documental de la Universidad de Valladolid Hispana