2026-05-05T21:59:03Zhttps://uvadoc.uva.es/oai/request

oai:uvadoc.uva.es:10324/805282025-12-11T20:00:48Zcom_10324_1159com_10324_931com_10324_894col_10324_1310

00925njm 22002777a 4500 dc Bouffetier, V. author Valdivia, M. P. author Ceurvorst, L. author Stutman, D. author Rigon, G. author Albertazzi, B. author Koenig, M. author Pikuz, T. author Ozaki, N. author Nakamura, H. author Hironaka, Y. author Miyanishi, K. author Yabuuchi, T. author Togashi, T. author Sueda, K. author Yabashi, M. author Goudal, T. author Mancelli, D. author Casner, A. author Pérez Callejo, Gabriel author 2025 X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics. Review of Scientific Instruments, Diciembre 2025, vol. 96, issue 12, 123508 0034-6748 https://uvadoc.uva.es/handle/10324/80528 10.1063/5.0307618 12 Review of Scientific Instruments 96 1089-7623 Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities