2026-04-28T19:33:56Zhttps://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/805282025-12-11T20:00:48Zcom_10324_1159com_10324_931com_10324_894col_10324_1310
Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities
Bouffetier, V.
Valdivia, M. P.
Ceurvorst, L.
Stutman, D.
Rigon, G.
Albertazzi, B.
Koenig, M.
Pikuz, T.
Ozaki, N.
Nakamura, H.
Hironaka, Y.
Miyanishi, K.
Yabuuchi, T.
Togashi, T.
Sueda, K.
Yabashi, M.
Goudal, T.
Mancelli, D.
Casner, A.
Pérez Callejo, Gabriel
Producción Científica
X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.
2025-12-11T17:03:46Z
2025-12-11T17:03:46Z
2025
info:eu-repo/semantics/article
Review of Scientific Instruments, Diciembre 2025, vol. 96, issue 12, 123508
0034-6748
https://uvadoc.uva.es/handle/10324/80528
10.1063/5.0307618
12
Review of Scientific Instruments
96
1089-7623
spa
info:eu-repo/semantics/openAccess
American Institute of Physics
SI