2026-04-28T19:51:37Zhttps://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/813642026-03-26T12:01:38Zcom_10324_1148com_10324_931com_10324_894col_10324_1270
Pereda, José A
Grande Sáez, Ana María
2026-01-12T14:20:13Z
2026-01-12T14:20:13Z
2025
IEEE Transactions on Antennas and Propagation, 2025, vol. 73, n.10, p. 8238-8241.
0018-926X
https://uvadoc.uva.es/handle/10324/81364
10.1109/TAP.2025.3581386
8238
10
8241
IEEE Transactions on Antennas and Propagation
73
1558-2221
Producción Científica
The Runge–Kutta finite-difference time-domain (RK
FDTD) method is an extension of the conventional finite-difference
time-domain (FDTD) technique to include graphene sheets. According to
this method, the relationship between the current density and the electric
field for graphene is discretizedby applying an explicit second-order
Runge–Kutta(RK) scheme. It has recently been concluded that the RK-FDTD method is subject to the same Courant–Friedrichs–Lewy (CFL)
stability limit as the conventional FDTD method. This communication
revisits the stability analysis of the RK-FDTD method. To this end, the von
Neumann method is combined with the Routh–Hurwitz (RH) criterion.
As a result, closed-form stability conditions are obtained. It is shown
that in addition to the CFL stability limit, the RK-FDTD method must
also satisfy new conditions involving graphene parameters. Unfortunately,
the RK-FDTD method becomes unstable for commonly used values of
these parameters. The theoretical results are confirmed with numerical
examples.
Ministerio de Ciencia e Innovación (PID2022-137619NB-I00)
application/pdf
spa
Institute of Electrical and Electronics Engineers (IEEE)
info:eu-repo/semantics/openAccess
http://creativecommons.org/licenses/by-nc-nd/4.0/
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
Finite-difference time-domain (FD-TD) method
Second-orderRunge–Kutta(RK) scheme
FDTD stability
Graphene
On the stability of the RK-FDTD method for graphene modeling
info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11051131
SI