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<dc:title>On the stability of the RK-FDTD method for graphene modeling</dc:title>
<dc:creator>Pereda, José A</dc:creator>
<dc:creator>Grande Sáez, Ana María</dc:creator>
<dc:description>Producción Científica</dc:description>
<dc:description>The Runge–Kutta finite-difference time-domain (RK&#xd;
FDTD) method is an extension of the conventional finite-difference&#xd;
time-domain (FDTD) technique to include graphene sheets. According to&#xd;
this method, the relationship between the current density and the electric&#xd;
field for graphene is discretizedby applying an explicit second-order&#xd;
Runge–Kutta(RK) scheme. It has recently been concluded that the RK-FDTD method is subject to the same Courant–Friedrichs–Lewy (CFL)&#xd;
stability limit as the conventional FDTD method. This communication&#xd;
revisits the stability analysis of the RK-FDTD method. To this end, the von&#xd;
Neumann method is combined with the Routh–Hurwitz (RH) criterion.&#xd;
As a result, closed-form stability conditions are obtained. It is shown&#xd;
that in addition to the CFL stability limit, the RK-FDTD method must&#xd;
also satisfy new conditions involving graphene parameters. Unfortunately,&#xd;
the RK-FDTD method becomes unstable for commonly used values of&#xd;
these parameters. The theoretical results are confirmed with numerical&#xd;
examples.</dc:description>
<dc:date>2026-01-12T14:20:13Z</dc:date>
<dc:date>2026-01-12T14:20:13Z</dc:date>
<dc:date>2025</dc:date>
<dc:type>info:eu-repo/semantics/article</dc:type>
<dc:identifier>IEEE Transactions on Antennas and Propagation,  2025, vol. 73, n.10, p. 8238-8241.</dc:identifier>
<dc:identifier>0018-926X</dc:identifier>
<dc:identifier>https://uvadoc.uva.es/handle/10324/81364</dc:identifier>
<dc:identifier>10.1109/TAP.2025.3581386</dc:identifier>
<dc:identifier>8238</dc:identifier>
<dc:identifier>10</dc:identifier>
<dc:identifier>8241</dc:identifier>
<dc:identifier>IEEE Transactions on Antennas and Propagation</dc:identifier>
<dc:identifier>73</dc:identifier>
<dc:identifier>1558-2221</dc:identifier>
<dc:language>spa</dc:language>
<dc:relation>https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&amp;arnumber=11051131</dc:relation>
<dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
<dc:rights>http://creativecommons.org/licenses/by-nc-nd/4.0/</dc:rights>
<dc:rights>Attribution-NonCommercial-NoDerivatives 4.0 Internacional</dc:rights>
<dc:publisher>Institute of Electrical and Electronics Engineers (IEEE)</dc:publisher>
<dc:peerreviewed>SI</dc:peerreviewed>
</ow:Publication>
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