2024-03-28T08:43:11Zhttps://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/351852023-06-06T12:13:03Zcom_10324_1158com_10324_931com_10324_894col_10324_1244
Sánchez, L.A.
Moretón Fernández, Ángel
Jiménez Martín, Marta María
Guada, Miguel
Rodríguez Conde, Sofía
González Rebollo, Miguel Ángel
Martínez Sacristán, Óscar
Jiménez López, Juan Ignacio
2018
There is an increasing demand for characterizing multicrystalline solar cells at different stages of its service life. Luminescence techniques, e.g. electroluminescence (EL) and photoluminescence (PL), have acquired a paramount interest in the last years. These techniques are used in imaging mode, allowing to take a luminescence picture at a full wafer/cell scale. This imaging approach is fast and sensitive, but has a low spatial resolution, which avoids a detailed analysis of the defect distribution, which can led to misinterpretations about critical parameters as the minority carrier diffusion length, or the internal and external quantum efficiencies. If one complements these techniques with high spatial resolution techniques, such as light beam induced current (LBIC), one can study the electrical activity of the defects at a micrometric scale, providing additional understanding about the role played by the defects in full wafer/cell luminescence images. The combination of the macroscopic and microscopic resolution scales is necessary for the analysis of the full luminescence images in mc-Si solar cells.
application/pdf
http://uvadoc.uva.es/handle/10324/35185
eng
WIP Renewable Energies
Electroluminescence Imaging and Light Beam Induced Current as Characterization Techniques of Multi-Crystalline Si Solar Cells [Poster]
info:eu-repo/semantics/conferenceObject
European Photovoltaic Solar Energy Conference and Exhibition
TEXT
UVaDOC. Repositorio Documental de la Universidad de Valladolid
Hispana