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<dc:title>Referenceless, grating-based, single shot X-ray phase contrast imaging with optimized laser-driven K-α sources</dc:title>
<dc:creator>Bouffetier, V.</dc:creator>
<dc:creator>Stutman, D.</dc:creator>
<dc:creator>Stoeckl, C.</dc:creator>
<dc:creator>Begishev, I. A.</dc:creator>
<dc:creator>Theobald, W.</dc:creator>
<dc:creator>Filkins, T.</dc:creator>
<dc:creator>Mileham, C.</dc:creator>
<dc:creator>Ceurvorst, L.</dc:creator>
<dc:creator>Klein, S. R.</dc:creator>
<dc:creator>Goudal, T.</dc:creator>
<dc:creator>Casner, A.</dc:creator>
<dc:creator>Valdivia, M. P.</dc:creator>
<dc:creator>Pérez Callejo, Gabriel</dc:creator>
<dc:subject>Física</dc:subject>
<dc:subject>Óptica</dc:subject>
<dc:description>Producción Científica</dc:description>
<dc:description>With its ability to efficiently probe low-Z materials, X-ray phase imaging methods have recently raised high interest in multiple fields from biology and medical applications to high energy density (HED) physics. Initially developed with synchrotron light and X-ray tubes, we present a novel grating based Talbot X-ray deflectometer (TXD) diagnostic that was coupled with laser-generated K-α X-ray sources. The multi-terawatt laser (I > 1 × 1014 W cm-2) was used as a testbed for diagnostic development. It was found that X-ray source chromaticity plays an important role in TXD. Indeed, the broadband spectrum of laser-generated X-ray sources may strongly impact image quality and thus diagnostic performance. We qualified X-ray emission from different laser-produced sources and determined laser, target, and deflectometer parameters that optimize TXD performance. We present the first results of referenceless grating-based X-ray imaging at high-power laser facilities and discuss the implications of this new development in HED research.</dc:description>
<dc:description>This work has also been supported by the Research Grants No.  PID2019-108764RB-I00 and PID2022-137632OB-I00 from the Spanish Ministry of Science and Innovation.</dc:description>
<dc:date>2024-09-11T08:32:11Z</dc:date>
<dc:date>2024-09-11T08:32:11Z</dc:date>
<dc:date>2024</dc:date>
<dc:type>info:eu-repo/semantics/article</dc:type>
<dc:type>info:eu-repo/semantics/acceptedVersion</dc:type>
<dc:identifier>Optics Express, Septiembre 2024, vol. 32, n. 20, p. 34694-34709</dc:identifier>
<dc:identifier>1094-4087</dc:identifier>
<dc:identifier>https://uvadoc.uva.es/handle/10324/69678</dc:identifier>
<dc:identifier>10.1364/OE.516695</dc:identifier>
<dc:identifier>34694</dc:identifier>
<dc:identifier>20</dc:identifier>
<dc:identifier>34709</dc:identifier>
<dc:identifier>Optics Express</dc:identifier>
<dc:identifier>32</dc:identifier>
<dc:identifier>1094-4087</dc:identifier>
<dc:language>spa</dc:language>
<dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
<dc:format>application/pdf</dc:format>
<dc:publisher>Optica Publishing Group</dc:publisher>
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<europeana:provider>Hispana</europeana:provider>
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