2024-03-29T15:26:23Zhttps://uvadoc.uva.es/oai/requestoai:uvadoc.uva.es:10324/446372021-06-24T07:23:04Zcom_10324_43510com_10324_954com_10324_894col_10324_43514
Capacitance Spectroscopy for MOS Systems
Dueñas Carazo, Salvador
Castán Lanaspa, María Helena
Semiconductores de óxido metálico
Producción Científica
Capacitance studies of metal–oxide–semiconductor (MOS) capacitors have been used since the early 60s of the past century to investigates the interface surface states, oxide charge and electron and ion phenomena in these structures. This chapter provides detailed information about the theoretical basis, and examples of application of capacitance spectroscopy techniques in a variety of MOS systems.
2021-01-07T13:36:30Z
2021-01-07T13:36:30Z
2018
info:eu-repo/semantics/bookPart
info:eu-repo/semantics/draft
Dueñas, Salvador; Castán, Helena. Capacitance Spectroscopy for MOS Systems. Capacitance Spectroscopy of Semiconductors, edited by Jian V. Li, Giorgio Ferrari. 1st Edition, 2018, Jenny Stanford Publishing. https://doi.org/10.1201/b22451
9781315150130
http://uvadoc.uva.es/handle/10324/44637
Capacitance Spectroscopy of Semiconductors
eng
https://www.taylorfrancis.com/books/capacitance-spectroscopy-semiconductors-jian-li-giorgio-ferrari/e/10.1201/b22451
info:eu-repo/semantics/restrictedAccess
application/pdf
Jenny Stanford Publishing