RT info:eu-repo/semantics/conferenceObject
T1 High resolution LBIC characterization of defects in mc-Si solar cells [Poster]
A1 Sánchez, L.A.
A1 Moretón Fernández, Ángel
A1 Guada, Miguel
A1 Rodríguez Conde, Sofía
A1 Martínez Sacristán, Óscar
A1 González Rebollo, Miguel Ángel
A1 Jiménez López, Juan Ignacio
AB Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal resolution using the Light-Beam Induced Current (LBIC) technique combined with a ELi - PLi system.
YR 2017
FD 2017
LK http://uvadoc.uva.es/handle/10324/35190
UL http://uvadoc.uva.es/handle/10324/35190
LA eng
NO 17th International Conference DRIP: Defects-Recognition, Imaging and Physics in Semiconductors, 8th to the 12th of October 2017, Valladolid, Spain
DS UVaDOC
RD 24-nov-2024