RT info:eu-repo/semantics/article
T1 InN Thin Film Lattice Dynamics by Grazing Incidence Inelastic X-Ray Scattering
A1 Serrano Gutiérrez, Jorge
AB Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoelectronic and solar cell applications in combination with other group III nitrides.
PB American Physical Society
YR 2011
FD 2011
LK https://uvadoc.uva.es/handle/10324/65240
UL https://uvadoc.uva.es/handle/10324/65240
LA eng
NO Phys. Rev. Lett. 106, 205501 (2011)
DS UVaDOC
RD 19-nov-2024