RT info:eu-repo/semantics/article
T1 Lattice Dynamics of 4H-SiC by Inelastic X-Ray Scattering
A1 Strempfer, J.
A1 Cardona, M.
A1 Schwoerer-Böhning, M.
A1 Requardt, H.
A1 Lorenzen, M.
A1 Stojetz, B.
A1 Pavone, P.
A1 Choyke, Wolfgang J.
A1 Serrano Gutiérrez, Jorge
AB We have measured the phonon dispersion relations of 4H-SiC by inelastic x-ray scattering (IXS) using monochromatized synchrotron radiation. The q-space directions Gamma-K-M, Gamma-M, and Gamma-A were mapped out. Lattice dynamical calculations that allowed the prediction of phonon eigenvectors, as well as their symmetries, also helped in choosing the best scattering geometries. The IXS phonon data are compared with those previously obtained from low temperature photoluminescence measurements and from laser Raman spectroscopy.
PB Trans Tech Publications Ltd.
YR 2003
FD 2003
LK https://uvadoc.uva.es/handle/10324/65343
UL https://uvadoc.uva.es/handle/10324/65343
LA eng
NO Materials Science Forum Vols 433-436 (2003) pp 257-260
DS UVaDOC
RD 23-nov-2024