RT info:eu-repo/semantics/article
T1 Comparison of Outdoor and Indoor PL and EL Images in Si Solar Cells and Panels for Defect Detection and Classification
A1 Terrados, C.
A1 González Francés, Diego
A1 Alonso Gómez, Víctor
A1 González Rebollo, Miguel Ángel
A1 Jiménez López, Juan Ignacio
A1 Martínez Sacristán, Óscar
AB Nowadays, silicon solar plants consist of hundreds of thousands of panels. The detection and characterization of solar cell defects, particularly on-site, is crucial to maintaining high productivity at the solar plant. Among the different techniques for the inspection of the solar cell defects, luminescence techniques provide very useful information about the spatial distribution of defects. Electroluminescence performed in dark conditions (nEL) is the most commonly used technique. However, daylight EL (dEL) and daylight photoluminescence (dPL) have recently attracted interest, because they present noteworthyadvantages for on-site inspections. In this paper, we present a detailed characterization of both damaged mono- and multicrystalline silicon solar cells using dEL and dPL, comparing the results provided by these techniques with those obtained with high-resolution nEL and indoor PL (performed under excitation with a laser diode). Among these techniques, dEL provides reliable and reproducible results, while dPL shows more dependence on the experimental conditions, demanding additional efforts for analysis. The limited resolution obtained with the actual IR camera technologies is a limiting factor of the dEL and dPL techniques. On the other hand, they can be performed on-site, testing a very large number of panels. Therefore, we can assert that on-site dEL is well suited for massive inspection of solar plants, while more research is necessary for dPL.
PB Springer
SN 0361-5235
YR 2023
FD 2023
LK https://uvadoc.uva.es/handle/10324/75209
UL https://uvadoc.uva.es/handle/10324/75209
LA eng
NO Journal of Electronic Materials (2023) 52:5189–5198
NO Producción Científica
DS UVaDOC
RD 24-abr-2025