RT info:eu-repo/semantics/article
T1 Simultaneous hard x-ray Talbot phase and dark-field imaging in laser experiments at XFEL facilities
A1 Bouffetier, V.
A1 Valdivia, M. P.
A1 Ceurvorst, L.
A1 Stutman, D.
A1 Rigon, G.
A1 Albertazzi, B.
A1 Koenig, M.
A1 Pikuz, T.
A1 Ozaki, N.
A1 Nakamura, H.
A1 Hironaka, Y.
A1 Miyanishi, K.
A1 Yabuuchi, T.
A1 Togashi, T.
A1 Sueda, K.
A1 Yabashi, M.
A1 Goudal, T.
A1 Mancelli, D.
A1 Casner, A.
A1 Pérez Callejo, Gabriel
AB X-ray Free Electron Laser (XFEL) facilities offer unprecedented opportunities to advance instrumentation for studying matter under extreme conditions. In this study, we harnessed the enhanced x-ray capabilities of XFELs to demonstrate dark field imaging in laser-driven experiments at XFEL facilities. Utilizing a Talbot x-ray interferometer, we simultaneously captured transmission, dark-field, and differential phase contrast radiographs of laser-driven metallic foils. Our work showcases the feasibility of single-shot grating-based Talbot x-ray dark-field imaging in pump-probe experiments at XFEL facilities, opening doors to a wide range of hard x-ray imaging applications in material science and high-energy density physics.
PB American Institute of Physics
SN 0034-6748
YR 2025
FD 2025
LK https://uvadoc.uva.es/handle/10324/80528
UL https://uvadoc.uva.es/handle/10324/80528
LA spa
NO Review of Scientific Instruments, Diciembre 2025, vol. 96, issue 12, 123508
NO Producción Científica
DS UVaDOC
RD 17-dic-2025