TY  - GEN 
AU  - López Martín, Pedro
AU  - Aboy Cebrián, María
AU  - Muñoz, I.
AU  - Santos Tejido, Iván
AU  - Marqués Cuesta, Luis Alberto
AU  - Couso, Carlos
AU  - Ullán, Miguel
AU  - Pelaz Montes, María Lourdes
PY  - 2019
SN  - 978-1-5386-5779-9
UR  - http://uvadoc.uva.es/handle/10324/33892
AB  - Electronic devices operating in harsh radiation environments must withstand high radiation levels with minimal performance degradation. Recent experiments on the radiation hardness of a new vertical p-type JFET power switch have shown a significant...
LA  - eng
PB  - Institute of Electrical and Electronics Engineers (IEEE).
KW  - Degradación de la corriente
KW  - Current degradation
KW  - Silicio
KW  - Silicon
TI  - IONDegradation in Si Devices in Harsh Radiation Environments: Modeling of Damage-Dopant Interactions
DO  - https://doi.org/10.1109/CDE.2018.8596953
ER  -