TY  - GEN 
AU  - Sánchez, L.A.
AU  - Moretón Fernández, Ángel
AU  - Guada, Miguel
AU  - Rodríguez Conde, Sofía
AU  - Martínez Sacristán, Óscar
AU  - González Rebollo, Miguel Ángel
AU  - Jiménez López, Juan Ignacio
PY  - 2017
UR  - http://uvadoc.uva.es/handle/10324/35190
AB  - Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal resolution using the Light-Beam Induced Current (LBIC) technique combined with a ELi - PLi system.
LA  - eng
TI  - High resolution LBIC characterization of defects in mc-Si solar cells [Poster]
ER  -