TY  - JOUR 
AU  - Zanotti, Tommaso
AU  - Zambelli, Cristian
AU  - Puglisi, Francesco Maria
AU  - Milo, Valerio
AU  - Pérez Díez, Eduardo
AU  - Mahadevaiah, Mamathamba K.
AU  - González Ossorio, Óscar
AU  - Wenger, Christian
AU  - Pavan, Paolo
AU  - Olivo, Piero
AU  - Ielmini, Daniele
PY  - 2020
SN  - 0018-9383
UR  - http://uvadoc.uva.es/handle/10324/45369
AB  - Logic-in-memory (LiM) circuits based on resistive random access memory (RRAM) devices and the material implication logic are promising candidates for the development of low-power computing devices that could fulfill the growing demand of distributed...
LA  - eng
PB  - Institute of Electrical and Electronics Engineers
KW  - Memoria RAM resistiva (RRAM)
KW  - Resistive RAM memory (RRAM)
TI  - Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays
DO  - 10.1109/TED.2020.3025271
ER  -