TY  - GEN 
AU  - Jimenez-Molinos, F.
AU  - Vinuesa Sanz, Guillermo
AU  - García, H.
AU  - Tarre, A.
AU  - Tamm, A.
AU  - Kalam, K.
AU  - Kukli, K.
AU  - Dueñas Carazo, Salvador
AU  - Castán Lanaspa, María Helena
AU  - González, M.B.
AU  - Campabadal, F.
AU  - Maldonado, D.
AU  - Cantudo, A.
AU  - Roldán, J.B.
PY  - 2023
SN  - 979-8-3503-0241-7
UR  - https://uvadoc.uva.es/handle/10324/66235
AB  - The thermal dependence of the resistance in the low resistance state of TiN/Ti/HfO 2 /Pt memristors has been experimentally studied. After modeling the measured I-V curves, the different resistive components (ohmic and non-linear) have been extracted...
LA  - eng
PB  - Institute of Electrical and Electronics Engineers (IEEE Xplore)
KW  - memristor
KW  - thermal dependence
KW  - resistive switching
TI  - Thermal Dependence of the Resistance of TiN/Ti/HfO2/Pt Memristors
DO  - 10.1109/CDE58627.2023.10339514
ER  -