TY  - JOUR 
AU  - Mistroni, Alberto
AU  - Jia, Ruolan
AU  - Dorai Swamy Reddy, Keerthi
AU  - Reichmann, Felix
AU  - Wenger, Christian
AU  - Perez, Eduardo
AU  - Castán Lanaspa, María Helena
AU  - Perez-Bosch Quesada, Emilio
AU  - Dueñas Carazo, Salvador
PY  - 2024
SN  - 0741-3106
UR  - https://uvadoc.uva.es/handle/10324/73756
AB  - Reliable data storage technologies able to operate at cryogenic temperatures are critical to implement scalable quantum computers and develop deep-space exploration systems, among other applications. Their scarce availability is pushing towards the...
LA  - eng
PB  - IEEE: Institute of Electrical and Electronics Engineers
KW  - 1T1R , CMOS , cryogenic temperatures , HfO2 , resistive switching , RRAM
KW  - Cryogenics
KW  - Logic gates
KW  - Switches
KW  - MOSFET
KW  - Voltage measurement
KW  - Switching circuits
KW  - Resistance
KW  - Hafnium oxide
KW  - Current measurement
KW  - Transmission electron microscopy
KW  - 1T1R
KW  - CMOS
KW  - Cryogenic temperatures
KW  - HfO2
KW  - Resistive switching
KW  - RRAM
TI  - Forming and Resistive Switching of HfO₂-Based RRAM Devices at Cryogenic Temperature
DO  - 10.1109/LED.2024.3485873
ER  -