TY  - GEN 
AU  - Durán Barroso, Ramón José
AU  - Abril Domingo, Evaristo José
AU  - Lorenzo Toledo, Rubén Mateo
AU  - Miguel Jiménez, Ignacio de
AU  - Fernández Reguero, Patricia
AU  - Aguado Manzano, Juan Carlos
AU  - Bahillo Martínez, Alfonso
AU  - Blas Prieto, Juan
AU  - Rosa Steinz, Ramón de la
AU  - Alonso Alonso, Alonso
AU  - Merayo Álvarez, Noemí
PY  - 2026
UR  - https://uvadoc.uva.es/handle/10324/82074
AB  - Circuits and codes implemented for paper "Developing AI-Resilient Assessments: A Case Study with Electric Circuits" IEEE Global Engineering Education Conference (EDUCON) 2026.

Usage Rights: These codes can be used freely by citing the author and...
LA  - eng
TI  - Circuits and codes implemented for paper "Developing AI-Resilient Assessments: A Case Study with Electric Circuits" IEEE Global Engineering Education Conference (EDUCON) 2026.
ER  -