TY  - JOUR 
AU  - Vaca Rodríguez, César
AU  - Gonzalez, Mireia B.
AU  - Castán Lanaspa, María Helena
AU  - García García, Héctor
AU  - Duenas, Salvador
AU  - Campabadal, Francesca
AU  - Miranda, Enrique
AU  - Bailon, Luis A.
PY  - 2016
SN  - 0018-9383
UR  - https://uvadoc.uva.es/handle/10324/82082
AB  - Resistive switching conduction in Ni/HfO2/Si capacitors is studied at temperatures ranging from 77 to 473 K. A model for the low-resistance state (LRS) consistent with the experimental data is proposed. The LRS current–voltage (I–V) curves show a...
LA  - eng
TI  - Study From Cryogenic to High Temperatures of the High- and Low-Resistance-State Currents of ReRAM Ni–HfO2–Si Capacitors
DO  - 10.1109/ted.2016.2546898
ER  -