español
English
français
Deutsch
português (Brasil)
italiano
Toggle navigation
español
English
français
Deutsch
português (Brasil)
italiano
español
English
français
Deutsch
português (Brasil)
italiano
Toggle navigation
JavaScript is disabled for your browser. Some features of this site may not work without it.
Search UVaDOC
This Collection
Browse
All of UVaDOC
Communities
By Issue Date
Authors
Subjects
Titles
My Account
Login
Statistics
View Usage Statistics
Share
Statistics
UVaDOC Home
SCIENTIFIC PRODUCTION
Departamentos
Dpto. Electricidad y Electrónica
DEP22 - Artículos de revista
Statistics
UVaDOC Home
SCIENTIFIC PRODUCTION
Departamentos
Dpto. Electricidad y Electrónica
DEP22 - Artículos de revista
Statistics
español
English
français
Deutsch
português (Brasil)
italiano
Statistics
Total Visits
Views
Modeling of defects, dopant diffusion and clustering in silicon
483
File Visits
Downloads
Modeling-defects-dopant.pdf
515
Select a period of time:
Previous month
Previous 6 months
Previous year
5 previous years
Views
Downloads
Number of views in the range
Views
Modeling of defects, dopant diffusion and clustering in silicon
99
Number of downloads in the range
Downloads
Modeling-defects-dopant.pdf
40
Views
Views
May 2024
5
June 2024
4
July 2024
17
August 2024
35
September 2024
17
October 2024
16
November 2024
5
Download CSV file
Bar graph
Line graph
Number of downloads in the period of time
Downloads
May 2024
1
June 2024
4
July 2024
4
August 2024
26
September 2024
1
October 2024
2
November 2024
2
Download CSV file
Bar graph
Line graph
Top country views
Views
United States
37
Singapore
34
Australia
8
Russia
5
France
5
India
4
Switzerland
2
China
1
Germany
1
Hong Kong
1
Top countries by downloads
Downloads
Hong Kong
26
United States
10
China
1
Germany
1
Australia
1
Top cities views
Views
Singapore
24
Ashburn
11
Boardman
5
Melbourne
4
Santa Clara
3
Prineville
2
Adelaide
1
Bhiwandi
1
Brisbane
1
Canberra
1
Top cities by downloads
Downloads
Ashburn
5