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    Por favor, use este identificador para citar o enlazar este ítem:http://uvadoc.uva.es/handle/10324/28963

    Título
    Sub-ångstrom Experimental Validation of Molecular Dynamics for Predictive Modeling of Extended Defect Structures in Si
    Autor
    Dudeck, Karleen J.
    Marqués Cuesta, Luis AlbertoAutoridad UVA Orcid
    Knights, Andrew P.
    Gwilliam, Russell M.
    Botton, Gianluigi A.
    Año del Documento
    2013
    Editorial
    American Physical Society
    Descripción
    Producción Científica
    Documento Fuente
    Physical Review Letters, 2013, Vol. 110, 166102
    Résumé
    n this Letter we present the detailed, quantitative comparison between experimentally and theoretically derived structures of the extended {311} defect in silicon. Agreement between experimental and theoretical column positions of better than ±0.05  nm has been achieved for all 100 atomic columns in the defect structure. This represents a calculated density of 5.5×1014 silicon interstitials per cm2 on {311} planes, in agreement with previous work [S. Takeda, Jpn. J. Appl. Phys., Part 2, 30, L639 (1991)]. We show that although the {311} defect is made up of five-, six-, seven-, and eight-member rings, the shape of these rings varies as a function of position along the defect, and these variations can be determined experimentally with high precision and accuracy. The excellent agreement between the calculated and experimentally derived structure, including the position of atomic columns and the shape of the distinct structural units of the defect, provides strong evidence for the quality and robustness of the molecular dynamics simulation approach for structural studies of defects. The experimental approach is straightforward, without the need for complicated image processing methods, and is therefore widely applicable.
    Palabras Clave
    Silicon
    Silicio
    ISSN
    0031-9007
    Revisión por pares
    SI
    DOI
    10.1103/PhysRevLett.110.166102
    Patrocinador
    Ministerio de Ciencia e Innovación (Proyect TEC2011-27701)
    Version del Editor
    https://journals.aps.org/prl/abstract/10.1103/PhysRevLett.110.166102
    Idioma
    eng
    URI
    http://uvadoc.uva.es/handle/10324/28963
    Derechos
    openAccess
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    • DEP22 - Artículos de revista [65]
    • Electrónica - Artículos de revista [33]
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    Attribution-NonCommercial-NoDerivatives 4.0 InternationalExcepté là où spécifié autrement, la license de ce document est décrite en tant que Attribution-NonCommercial-NoDerivatives 4.0 International

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