Statistics

Total Visits

	Views
Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation	521

File Visits

	Downloads
2018_Santos_JEM_47.pdf	530

Select a period of time:

ViewsDownloads

Number of views in the range

	Views
Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation	72

Number of downloads in the range

	Downloads
2018_Santos_JEM_47.pdf	53

Views

	Views
March 2024	4
April 2024	13
May 2024	7
June 2024	2
July 2024	12
August 2024	27
September 2024	7

Download CSV file

Bar graph

Line graph

Number of downloads in the period of time

Downloads
March 2024

4
April 2024

1
May 2024

2
June 2024

4
July 2024

5
August 2024

33
September 2024

4
Download CSV file

Bar graph

Line graph

Top country views

	Views
United States	39
Singapore	21
China	5
Russia	3
Switzerland	1
Indonesia	1
India	1
Taiwan	1

Top countries by downloads

	Downloads
China	27
United States	13
Russia	3
Switzerland	1
Indonesia	1

Top cities views

	Views
Singapore	16
Ashburn	9
Welsh	4
Indianola	4
Santa Clara	3
Inglewood	1
Jakarta	1
Jiaxing	1
Shanghai	1
Taipei	1

Top cities by downloads

	Downloads
Ashburn	3
Indianola	2
Jakarta	1