Statistics

Total Visits

	Views
Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation	844

File Visits

	Downloads
2018_Santos_JEM_47.pdf	587

Select a period of time:

ViewsDownloads

Number of views in the range

	Views
Identification of Extended Defect Atomic Configurations in Silicon Through Transmission Electron Microscopy Image Simulation	292

Number of downloads in the range

	Downloads
2018_Santos_JEM_47.pdf	32

Views

	Views
February 2025	10
March 2025	6
April 2025	7
May 2025	108
June 2025	106
July 2025	42
August 2025	13

Download CSV file

Bar graph

Line graph

Number of downloads in the period of time

Downloads
February 2025

5
March 2025

10
April 2025

6
May 2025

1
June 2025

2
July 2025

3
August 2025

5
Download CSV file

Bar graph

Line graph

Top country views

	Views
United States	206
Spain	16
China	14
Brazil	14
Russia	12
Singapore	7
Hong Kong	6
Romania	4
Venezuela	3
Germany	2

Top countries by downloads

	Downloads
United States	11
Singapore	3
Germany	3
Romania	2
China	2
Russia	1

Top cities views

	Views
Council Bluffs	16
Shanghai	10
Central	6
Craiova	4
Inglewood	3
Singapore	2
São Paulo	2
Huangpu	2
Amsterdam	1
Ararangua	1

Top cities by downloads

	Downloads
Council Bluffs	2