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SCIENTIFIC PRODUCTION
Departamentos
Dpto. Electricidad y Electrónica
DEP22 - Artículos de revista
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UVaDOC Home
SCIENTIFIC PRODUCTION
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Dpto. Electricidad y Electrónica
DEP22 - Artículos de revista
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Temperature effect on damage generation mechanisms during ion implantation in Si. A classical molecular dynamics study
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2012_Santos_AIPCP_1496.pdf
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Temperature effect on damage generation mechanisms during ion implantation in Si. A classical molecular dynamics study
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2012_Santos_AIPCP_1496.pdf
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