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Título
Electroluminescence Imaging and Light Beam Induced Current as Characterization Techniques of Multi-Crystalline Si Solar Cells [Poster]
Otros títulos
European Photovoltaic Solar Energy Conference and Exhibition
Autor
Congreso
35th European Photovoltaic Solar Energy Conference and Exhibition EUPVSEC 2018
Año del Documento
2018
Editorial
WIP Renewable Energies
Documento Fuente
35th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC 2018), 24 - 28 September 2018, Brussels, Belgium
Zusammenfassung
There is an increasing demand for characterizing multicrystalline solar cells at different stages of its service life. Luminescence techniques, e.g. electroluminescence (EL) and photoluminescence (PL), have acquired a paramount interest in the last years. These techniques are used in imaging mode, allowing to take a luminescence picture at a full wafer/cell scale. This imaging approach is fast and sensitive, but has a low spatial resolution, which avoids a detailed analysis of the defect distribution, which can led to misinterpretations about critical parameters as the minority carrier diffusion length, or the internal and external quantum efficiencies. If one complements these techniques with high spatial resolution techniques, such as light beam induced current (LBIC), one can study the electrical activity of the defects at a micrometric scale, providing additional understanding about the role played by the defects in full wafer/cell luminescence images. The combination of the macroscopic and microscopic resolution scales is necessary for the analysis of the full luminescence images in mc-Si solar cells.
Palabras Clave
Fotoluminiscencia
Photoluminescence
Patrocinador
Junta de Castilla y León (programa de apoyo a proyectos de investigación - Ref.VA081U16)
Ministerio de Economía, Industria y Competitividad (Proyect ENE2014-56069-C4-4-R)
Ministerio de Economía, Industria y Competitividad (Proyect ENE2014-56069-C4-4-R)
Nota
Póster
Version del Editor
Idioma
eng
Derechos
openAccess
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