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Título
Automatic Quantitative Analysis of Silicon Solar Panels Based on Statistical Parameters from Electro- and Photoluminescence Images [Poster]
Otros títulos
European Photovoltaic Solar Energy Conference and Exhibition
Autor
Congreso
35th European Photovoltaic Solar Energy Conference and Exhibition EUPVSEC 2018
Año del Documento
2018
Editorial
WIP Renewable Energies
Documento Fuente
35th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC 2018), 24 - 28 September 2018, Brussels, Belgium
Abstract
There are many characterization techniques available to evaluate the health of solar panels, such as I-V characterization, infrared thermography (IR), photoluminescence (PL) and electroluminescence (EL). EL imaging has become in recent years a powerful diagnostic tool to evaluate PV modules. EL images allow to detect several defects and degradation modes in the solar cells. The failures are observed as dark contrasted areas in the images. Broad dark regions can be detected even in a low resolution image, while a high resolution image is needed to detect some more specific problems such as cracks, multi-cracks or other line-shaped defects.
Palabras Clave
Fotoluminiscencia
Photoluminescence
Patrocinador
Junta de Castilla y León (programa de apoyo a proyectos de investigación - Ref. VA081U16)
Ministerio de Economía, Industria y Competitividad (Proyect ENE2014-56069-C4-4-R)
Ministerio de Economía, Industria y Competitividad (Proyect ENE2014-56069-C4-4-R)
Nota
Póster
Version del Editor
Idioma
eng
Derechos
openAccess
Collections
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